High temperature dependency of the resonant frequency of silicon-based resonators poses a major challenge. More specifically, due to factors like thermal expansion and Young's modulus temperature dependence, its resonant frequency fluctuates when there is a change in temperature and generally has a temperature coefficient of - 40ppm/°C. This means that for its operating temperature limit (-40°C~80°C), the resonant frequency will fluctuate in the 5000ppm range, making it very difficult to ensure precise output frequency in the resonator.
Now, Seiko Instruments is claiming to have successfully developed manufacturing technology that can improve the problem of temperature dependence of the resonant frequency in silicon based MEMS resonators by adding a layer of silicon dioxide film to the MEMS resonator fabricated on the SOI (silicon on insulator) substrate, and employing a structure that would produce residual stress within the resonator.

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