(Press Release) -- SUSS MicroTec AG, a leading manufacturer of probe systems used to characterize semiconductor devices at wafer level, has installed the latest 300 mm technology in wafer probe systems at the nanoelectronics research center IMEC in Leuven, Belgium. Both PA300PS ProbeShield® semiautomatic probe systems with ReAlign™ and ContactView™ technology and PA300 probe systems for RF-noise and S-parameter measurements have been installed. An agreement has been made for further collaboration on enhancing 300 mm probe systems in the following years.
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