Inspectrology, LLC, a leading supplier of overlay metrology for controlling lithography and etch processes in the compound semiconductor and MEMS market, was acquired by Onto Innovation Inc. on December 31, 2020. The transaction is expected to provide revenue synergies by leveraging Onto Innovation’s broader access to global markets, especially in Asia. The Inspectrology team will be able to leverage Onto Innovation’s R&D resources and larger customer support organization to better serve its customers.
